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Cited 9 time in webofscience Cited 0 time in scopus
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dc.contributor.authorKIM, H-
dc.contributor.authorKWON, O-
dc.contributor.authorLEE, JJ-
dc.contributor.authorLEE, JL-
dc.contributor.authorMUN, JK-
dc.contributor.authorPARK, HM-
dc.contributor.authorPARK, SC-
dc.date.accessioned2016-03-31T14:38:05Z-
dc.date.available2016-03-31T14:38:05Z-
dc.date.created2009-02-28-
dc.date.issued1994-04-28-
dc.identifier.issn0013-5194-
dc.identifier.other1994-OAK-0000008907-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/21956-
dc.description.abstractHigh-low doped metal semiconductor field effect transistors (MESFETs) operating at a drain bias of 3.3V have been developed. The MESFETs with 0.6mum gate length and 12mm gate width show a maximum drain current density of 310mA/mm and a uniform transconductance of around 112mS, ranging from V(gs) = -1.8V to 0.5V. The device tested at 3.3V drain bias and 900MHz demonstrates an output power of 30.9dBm with associate power-added-efficiency of 65% for an input power of 20dBm.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEE-INST ELEC ENG-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.title3.3V OPERATION GAAS POWER MESFETS WITH 65-PERCENT POWER-ADDED EFFICIENCY FOR HAND-HELD TELEPHONES-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1049/el:19940477-
dc.author.googleKIM, H-
dc.author.googleKWON, O-
dc.author.googleLEE, JJ-
dc.author.googleLEE, JL-
dc.author.googleMUN, JK-
dc.author.googlePARK, HM-
dc.author.googlePARK, SC-
dc.relation.volume30-
dc.relation.startpage739-
dc.relation.lastpage740-
dc.contributor.id10105416-
dc.relation.journalELECTRONICS LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.30, no.9, pp.739 - 740-
dc.identifier.wosidA1994NM54600042-
dc.citation.endPage740-
dc.citation.number9-
dc.citation.startPage739-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume30-
dc.contributor.affiliatedAuthorLEE, JL-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc8-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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이종람LEE, JONG LAM
Dept of Materials Science & Enginrg
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