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Cited 2 time in webofscience Cited 2 time in scopus
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dc.contributor.authorHAN, KH-
dc.contributor.authorKU, JK-
dc.contributor.authorLEE, SH-
dc.contributor.authorLEE, SI-
dc.contributor.authorSHIN, HJ-
dc.date.accessioned2016-04-01T00:58:09Z-
dc.date.available2016-04-01T00:58:09Z-
dc.date.created2009-03-19-
dc.date.issued1991-11-
dc.identifier.issn0953-2048-
dc.identifier.other1992-OAK-0000008539-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/22224-
dc.description.abstractThe measurement of the normalized noise power spectral density (Sn(f) = S(v)(f)/V2) of the YBCO microbridge shows 1/f(alpha) dependence. The key features of the present measurements are as follows: (1) in the normal state, S(n)(f) is several orders of magnitude larger than the value predicted by Hooge; (2) near T(c) Sn(f) increases by several orders of magnitude and alpha-approaches 2; (3) the noise power increases in a magnetic field near T(c). This enhancement of S(n)(f) seems to be related to fluctuation at the phase transition due to the instability of Cooper pair formation and breaking.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.relation.isPartOfSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.title1/F NOISE IN THE RESISTIVE TRANSITION REGION OF HIGH-TEMPERATURE SUPERCONDUCTOR YBCO MICROBRIDGED THIN-FILMS-
dc.typeArticle-
dc.contributor.college화학과-
dc.identifier.doi10.1088/0953-2048/4/11/034-
dc.author.googleHAN, KH-
dc.author.googleKU, JK-
dc.author.googleLEE, SH-
dc.author.googleLEE, SI-
dc.author.googleSHIN, HJ-
dc.relation.volume4-
dc.relation.startpage677-
dc.relation.lastpage679-
dc.contributor.id10087475-
dc.relation.journalSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationSUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.4, no.11, pp.677 - 679-
dc.identifier.wosidA1991HA19300035-
dc.citation.endPage679-
dc.citation.number11-
dc.citation.startPage677-
dc.citation.titleSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.citation.volume4-
dc.contributor.affiliatedAuthorKU, JK-
dc.identifier.scopusid2-s2.0-36149028759-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.type.docTypeArticle-
dc.subject.keywordPlusRESISTANCE FLUCTUATIONS-
dc.subject.keywordPlusSQUIDS-
dc.subject.keywordPlus77-K-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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