Article
Cited 13 time in 
Cited 13 time in 
Cited 13 time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ghong, TH | - |
| dc.contributor.author | Kim, YD | - |
| dc.contributor.author | Ahn, E | - |
| dc.contributor.author | Yoon, E | - |
| dc.contributor.author | An, SJ | - |
| dc.contributor.author | Yi, GC | - |
| dc.date.accessioned | 2016-04-01T01:05:46Z | - |
| dc.date.available | 2016-04-01T01:05:46Z | - |
| dc.date.created | 2009-02-28 | - |
| dc.date.issued | 2008-11-30 | - |
| dc.identifier.issn | 0169-4332 | - |
| dc.identifier.other | 2008-OAK-0000008311 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/22401 | - |
| dc.description.abstract | By using spectral reflectance (SR), we report on the in situ monitoring of ZnO nanorod growth on Si and sapphire substrates by catalyst-free, low pressure metalorganic chemical vapor deposition. Initially, the SR signals showed the same behavior at various wavelengths but at some point they began to strongly interfere and oscillate. This is interpreted as the starting point of the growth of nanorods. Simulation results using a multilayer model confimed our analysis. (c) 2008 Elsevier B.V. All rights reserved. | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | ELSEVIER SCIENCE BV | - |
| dc.relation.isPartOf | APPLIED SURFACE SCIENCE | - |
| dc.subject | ZnO nanorod | - |
| dc.subject | Silicon | - |
| dc.subject | Spectral reflectance | - |
| dc.subject | In situ monitoring | - |
| dc.subject | OPTICAL-PROPERTIES | - |
| dc.title | Application of spectral reflectance to the monitoring of ZnO nanorod growth | - |
| dc.type | Article | - |
| dc.contributor.college | 신소재공학과 | - |
| dc.identifier.doi | 10.1016/j.apsusc.2008.07.048 | - |
| dc.author.google | Ghong, T. H. | - |
| dc.author.google | Kim, Y. D. | - |
| dc.author.google | Ahn, E. | - |
| dc.author.google | Yoon, E. | - |
| dc.author.google | An, S. J. | - |
| dc.author.google | Yi, G-C. | - |
| dc.relation.volume | 255 | - |
| dc.relation.issue | 3 | - |
| dc.relation.startpage | 746 | - |
| dc.relation.lastpage | 748 | - |
| dc.relation.journal | APPLIED SURFACE SCIENCE | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCI | - |
| dc.collections.name | Conference Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.255, no.3, pp.746 - 748 | - |
| dc.identifier.wosid | 000260925100040 | - |
| dc.date.tcdate | 2018-07-01 | - |
| dc.citation.endPage | 748 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 746 | - |
| dc.citation.title | APPLIED SURFACE SCIENCE | - |
| dc.citation.volume | 255 | - |
| dc.contributor.affiliatedAuthor | Yi, GC | - |
| dc.identifier.scopusid | 2-s2.0-55649100059 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 12 | - |
| dc.type.docType | Article; Proceedings Paper | - |
| dc.subject.keywordAuthor | ZnO nanorod | - |
| dc.subject.keywordAuthor | Silicon | - |
| dc.subject.keywordAuthor | Spectral reflectance | - |
| dc.subject.keywordAuthor | In situ monitoring | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이규철YI, GYU CHUL
- Dept of Materials Science & Enginrg