DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SY | - |
dc.contributor.author | Nam, K | - |
dc.contributor.author | Song, HS | - |
dc.contributor.author | Kim, HG | - |
dc.date.accessioned | 2016-04-01T01:25:00Z | - |
dc.date.available | 2016-04-01T01:25:00Z | - |
dc.date.created | 2009-03-19 | - |
dc.date.issued | 2008-03 | - |
dc.identifier.issn | 0278-0046 | - |
dc.identifier.other | 2008-OAK-0000007577 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/22880 | - |
dc.description.abstract | The dc-dc converter is a critical component in a hybrid electric vehicle since it supplies power to an electronic control unit, as well as chassis electric components such as power windows, wipers, etc. In this paper, a low-cost diagnostic method for MOSFET faults in a zero-voltage-switching dc-dc converter is proposed. The proposed method utilizes the dc-link current patterns as the signatures of faults of MOSFETs. A presignal processing circuit consists of a peak detector and an integrator circuit. The ratio of peak-to-integral values, which is similar to the crest factor, is useful for diagnosis. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGI | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.subject | crest factor | - |
dc.subject | dc-dc converter | - |
dc.subject | fault diagnosis | - |
dc.subject | MOSFET | - |
dc.subject | NEURAL-NETWORK | - |
dc.subject | VOLTAGE | - |
dc.subject | SYSTEMS | - |
dc.subject | DRIVE | - |
dc.title | Fault diagnosis of a ZVS dc-dc converter based on dc-link current pulse shapes | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1109/TIE.2007.910627 | - |
dc.author.google | Kim, SY | - |
dc.author.google | Nam, K | - |
dc.author.google | Song, HS | - |
dc.author.google | Kim, HG | - |
dc.relation.volume | 55 | - |
dc.relation.issue | 3 | - |
dc.relation.startpage | 1491 | - |
dc.relation.lastpage | 1494 | - |
dc.contributor.id | 10071835 | - |
dc.relation.journal | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v.55, no.3, pp.1491 - 1494 | - |
dc.identifier.wosid | 000253872900052 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 1494 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 1491 | - |
dc.citation.title | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | - |
dc.citation.volume | 55 | - |
dc.contributor.affiliatedAuthor | Nam, K | - |
dc.identifier.scopusid | 2-s2.0-41349086697 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 40 | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | crest factor | - |
dc.subject.keywordAuthor | dc-dc converter | - |
dc.subject.keywordAuthor | fault diagnosis | - |
dc.subject.keywordAuthor | MOSFET | - |
dc.relation.journalWebOfScienceCategory | Automation & Control Systems | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Automation & Control Systems | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
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