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Experimental analysis of GaNHEMT and Si LDMOS in analog predistortion power amplifiers for WCDMA applications SCIE SCOPUS

Title
Experimental analysis of GaNHEMT and Si LDMOS in analog predistortion power amplifiers for WCDMA applications
Authors
Lee, YSLee, MWJeong, YH
Date Issued
2008-02
Publisher
JOHN WILEY & SONS INC
Abstract
Comparative analysis of GaN HEMT and Si LDMOS in analog predistortion power amplifiers (PAs) for WCDMA applications is represented. For validation, GaN HEMT and Si LDMOS PAs are designed and implemented with an analog predistorter, and tested for one-tone and 4-carrier WCDMA signals at 2.14 GHz. The measured results show that the GaN HEMT PA shows better predistortabilhy and more stable temperature and frequency characteristics compared with the Si LDMOS PA. (C) 2007 Wiley Periodicals, Inc.
Keywords
gallium nitride (GaN); power amplifier (PA); predistorter (PD); silicon (Si); temperature
URI
https://oasis.postech.ac.kr/handle/2014.oak/23006
DOI
10.1002/MOP.23134
ISSN
0895-2477
Article Type
Article
Citation
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, vol. 50, no. 2, page. 393 - 396, 2008-02
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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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