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Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy SCIE SCOPUS

Title
Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy
Authors
Choi, DJeon, JLee, PHwang, WLee, KPark, H
Date Issued
2007-08
Publisher
ELSEVIER SCI LTD
Abstract
This paper determines the Young's modulus of nanohoneycomb structures by flexural testing in an atomic force microscope (AFM). Since the cross-sectional area of nanohoneycomb structures varies along the structure, the area moment of inertia is not a constant. The area moment of inertia is also influenced by the porosity of the nanohoneycomb structure. An anodic aluminum oxide (AAO) film is fabricated as a nanohoneycomb structure. Young's modulus of the AAO film, measured from the results of flexural testing in AFM, is in good agreement with the results of tensile tests in a Nano-UTM (universal testing machine). (C) 2006 Elsevier Ltd. All rights reserved.
Keywords
nanohoneycomb structure; Young' s modulus; AFM; nano-UTM; SINGLE-CRYSTAL SILICON; MECHANICAL-PROPERTIES; BENDING TEST; INTERMEDIATE TEMPERATURES; NANOSCALE STRUCTURES; NANOWIRE ARRAYS; THIN-FILMS; AFM; ALUMINUM; WIRE
URI
https://oasis.postech.ac.kr/handle/2014.oak/23361
DOI
10.1016/j.compstruct.2006.02.023
ISSN
0263-8223
Article Type
Article
Citation
COMPOSITE STRUCTURES, vol. 79, no. 4, page. 548 - 553, 2007-08
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박현철PARK, HYUN CHUL
엔지니어링 대학원
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