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Cited 4 time in webofscience Cited 2 time in scopus
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dc.contributor.authorKim, IW-
dc.contributor.authorKim, HS-
dc.contributor.authorDoh, SJ-
dc.contributor.authorJe, JH-
dc.contributor.authorCho, TS-
dc.date.accessioned2016-04-01T01:44:44Z-
dc.date.available2016-04-01T01:44:44Z-
dc.date.created2009-02-28-
dc.date.issued2006-12-
dc.identifier.issn1385-3449-
dc.identifier.other2007-OAK-0000006533-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/23609-
dc.description.abstractWe investigated the temperature dependence of growth mode in highly mismatched sputter-grown ZnO/Al2O3(0001) heteroepitaxial films using real-time synchrotron X-ray scattering. We find that the growth mode changes from 2 dimensional (2D) layer to 3D island in early growth stage with temperature (300 degrees C - 500 degrees C). At around 400 degrees C, however, intermediate 2D platelets nucleate in early stage, act as nucleation cores of 3D islands and transform to misaligned state during further growth. The results of the strain evolution during growth suggest that the surface diffusion is a major factor in determining the growth mode in the strained ZnO/Al2O3( 0001) heteroepitaxy.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherSPRINGER-
dc.relation.isPartOfJOURNAL OF ELECTROCERAMICS-
dc.subjectgrowth mode-
dc.subjectstrain evolution-
dc.subjectZnO-
dc.subjectsputtering-
dc.subjectX-RAY-SCATTERING-
dc.subjectEPITAXIAL LAYERS-
dc.subjectHETEROEPITAXY-
dc.titleGrowth mode in strained ZnO films on Al2O3(0001) during sputtering-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1007/s10832-006-6288-2-
dc.author.googleKim, IW-
dc.author.googleKim, HS-
dc.author.googleDoh, SJ-
dc.author.googleJe, JH-
dc.author.googleCho, TS-
dc.relation.volume17-
dc.relation.issue39848-
dc.relation.startpage327-
dc.relation.lastpage330-
dc.contributor.id10123980-
dc.relation.journalJOURNAL OF ELECTROCERAMICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameConference Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF ELECTROCERAMICS, v.17, no.39848, pp.327 - 330-
dc.identifier.wosid000243610600040-
dc.date.tcdate2019-01-01-
dc.citation.endPage330-
dc.citation.number39848-
dc.citation.startPage327-
dc.citation.titleJOURNAL OF ELECTROCERAMICS-
dc.citation.volume17-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-33847204071-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc4-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusX-RAY-SCATTERING-
dc.subject.keywordPlusEPITAXIAL LAYERS-
dc.subject.keywordPlusHETEROEPITAXY-
dc.subject.keywordAuthorgrowth mode-
dc.subject.keywordAuthorstrain evolution-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthorsputtering-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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