Impedance analysis with longitudinal bunch-shape measurements
SCIE
SCOPUS
KCI
- Title
- Impedance analysis with longitudinal bunch-shape measurements
- Authors
- Hwang, I; Yoon, M; Kim, ES
- Date Issued
- 2006-03
- Publisher
- KOREAN PHYSICAL SOC
- Abstract
- We used a streak camera to measure the longitudinal bunch shape of a circulating electron beam in the 2.5-GeV Pohang Light Source (PLS). The measured results were analyzed by an (R+ L) series model to obtain a resistance R = 1.1 k Omega, an inductance L = 89 nH, and a longitudinal impedance vertical bar Z/n vertical bar(eff) = 0.6 Omega. The scaling law for the bunch lengthening is expressed as sigma(i) proportional to I-0.22 +/- (0.01). The effect of insertion device in the ring on the impedance, particularly the effect of the vertical height of the in-vacuum undulator currently placed in the PLS ring, is presented.
- Keywords
- coupling impedance; bunch lengthening; potential-well distortion; MICROWAVE INSTABILITY
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/24135
- ISSN
- 0374-4884
- Article Type
- Article
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 48, no. 3, page. 371 - 376, 2006-03
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