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Impedance analysis with longitudinal bunch-shape measurements SCIE SCOPUS KCI

Title
Impedance analysis with longitudinal bunch-shape measurements
Authors
Hwang, IYoon, MKim, ES
Date Issued
2006-03
Publisher
KOREAN PHYSICAL SOC
Abstract
We used a streak camera to measure the longitudinal bunch shape of a circulating electron beam in the 2.5-GeV Pohang Light Source (PLS). The measured results were analyzed by an (R+ L) series model to obtain a resistance R = 1.1 k Omega, an inductance L = 89 nH, and a longitudinal impedance vertical bar Z/n vertical bar(eff) = 0.6 Omega. The scaling law for the bunch lengthening is expressed as sigma(i) proportional to I-0.22 +/- (0.01). The effect of insertion device in the ring on the impedance, particularly the effect of the vertical height of the in-vacuum undulator currently placed in the PLS ring, is presented.
Keywords
coupling impedance; bunch lengthening; potential-well distortion; MICROWAVE INSTABILITY
URI
https://oasis.postech.ac.kr/handle/2014.oak/24135
ISSN
0374-4884
Article Type
Article
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 48, no. 3, page. 371 - 376, 2006-03
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