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dc.contributor.authorBaek, CH-
dc.contributor.authorOh, TK-
dc.contributor.authorKang, BK-
dc.date.accessioned2016-04-01T02:04:49Z-
dc.date.available2016-04-01T02:04:49Z-
dc.date.created2009-02-28-
dc.date.issued2005-08-
dc.identifier.issn0038-1101-
dc.identifier.other2005-OAK-0000005437-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/24369-
dc.description.abstractThis paper presents the effect of surface treatment on the electrical properties of an AlGaAs/GaAs heterojunction bipolar transistor (HBT). The extrinsic base surface of the HBT was treated in sequence with a (NH4)(2)S-x:H2O = 1:1 solution, H-2 plasma, and NH3 plasma. The treated HBT had a lower surface recombination current, base resistance, and low-frequency base current noise than the untreated HBT. These values decreased by 32%, 42%, and similar to 3 dB, respectively. Because of the reduced base resistance, the maximum frequency of oscillation f(max), which was 40.3 GHz without surface treatment, improved to 57.8 GHz. (c) 2005 Elsevier Ltd. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.relation.isPartOfSOLID-STATE ELECTRONICS-
dc.subjectsurface treatment-
dc.subjectheterojunction bipolar transistor-
dc.subjectideality factor-
dc.subject1/f noise-
dc.subjectmaximum oscillation frequency-
dc.subjectEQUIVALENT-CIRCUIT-
dc.subjectCURRENT GAIN-
dc.subjectPASSIVATION LAYER-
dc.subjectEXTRACTION-
dc.subjectGAAS-
dc.subjectHBTS-
dc.titleEffect of surface treatment on electrical properties of AlGaAs/GaAs heterojunction bipolar transistor-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1016/J.SSE.2005.0-
dc.author.googleBaek, CH-
dc.author.googleOh, TK-
dc.author.googleKang, BK-
dc.relation.volume49-
dc.relation.issue8-
dc.relation.startpage1335-
dc.relation.lastpage1340-
dc.contributor.id10071834-
dc.relation.journalSOLID-STATE ELECTRONICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationSOLID-STATE ELECTRONICS, v.49, no.8, pp.1335 - 1340-
dc.identifier.wosid000232269600013-
dc.date.tcdate2019-01-01-
dc.citation.endPage1340-
dc.citation.number8-
dc.citation.startPage1335-
dc.citation.titleSOLID-STATE ELECTRONICS-
dc.citation.volume49-
dc.contributor.affiliatedAuthorKang, BK-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.type.docTypeArticle-
dc.subject.keywordPlusEQUIVALENT-CIRCUIT-
dc.subject.keywordPlusCURRENT GAIN-
dc.subject.keywordPlusPASSIVATION LAYER-
dc.subject.keywordPlusEXTRACTION-
dc.subject.keywordPlusGAAS-
dc.subject.keywordPlusHBTS-
dc.subject.keywordAuthorsurface treatment-
dc.subject.keywordAuthorheterojunction bipolar transistor-
dc.subject.keywordAuthorideality factor-
dc.subject.keywordAuthor1/f noise-
dc.subject.keywordAuthormaximum oscillation frequency-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-

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강봉구KANG, BONG KOO
Dept of Electrical Enginrg
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