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Electroreflectance study of Zn0.8Mg0.20/ZnO nanorod heterostructures SCIE SCOPUS KCI

Title
Electroreflectance study of Zn0.8Mg0.20/ZnO nanorod heterostructures
Authors
Kim, SSLim, HJCheong, HPark, WIYi, GC
Date Issued
2005-06
Publisher
KOREAN PHYSICAL SOC
Abstract
ZnO, due to its large exciton binding energy which enables excitonic recombination at room temperature, is attracting much attention as a material for room-temperature UV devices. In particular, ZnO nanorod has attracted a great deal of attention because of the commercial interest in short-wavelength semiconductor laser diodes and nanometer-scale electronic devices. Zn0.8Mg0.2O/ZnO nanorod heterostructures were grown by metal-organic vapor-phase epitaxy on catalyst-free ZnO nanorods. Electro reflectance measurements were carried out at temperatures between 90 K and 295 K and compared with photoluminescence data. Quantum confinement effects in Zn0.8Mg0.2O/ZnO nanorod heterostructures were observed.
Keywords
zinc oxide; nanorod; heterostructure; electroreflectance; PHASE EPITAXIAL-GROWTH; THIN-FILMS; ROOM-TEMPERATURE; ZNO
URI
https://oasis.postech.ac.kr/handle/2014.oak/24492
ISSN
0374-4884
Article Type
Article
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 46, page. S214 - S217, 2005-06
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이규철YI, GYU CHUL
Dept of Materials Science & Enginrg
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