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Cited 106 time in webofscience Cited 118 time in scopus
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dc.contributor.authorRadmilovic-Radjenovic, M-
dc.contributor.authorLee, JK-
dc.contributor.authorIza, F-
dc.contributor.authorPark, GY-
dc.date.accessioned2016-04-01T02:10:33Z-
dc.date.available2016-04-01T02:10:33Z-
dc.date.created2009-02-28-
dc.date.issued2005-03-21-
dc.identifier.issn0022-3727-
dc.identifier.other2005-OAK-0000005133-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/24586-
dc.description.abstractGas breakdown in large scale systems has been widely studied and is reasonably well understood. Deviations from the well-known Paschen law, however, have been reported in microgaps. One possible mechanism responsible for these deviations is the increase of the secondary electron emission yield due to the quantum tunnelling of electrons from the metal electrodes to the gas phase. The high electric fields obtained in small gaps combined with the lowering of the potential barrier seen by the electrons in the cathode as an ion approaches lead to the onset of ion-enhanced field emissions. Particle-in-cell/Monte Carlo simulations including ion-enhanced field emission have been performed to evaluate the importance of these mechanisms in the discharge breakdown. Deviations from the Paschen curve in gaps smaller than 5 mu m can be explained based on this mechanism.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.relation.isPartOfJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.subjectELECTRIC-FIELD BREAKDOWN-
dc.subjectMICROMETER SEPARATIONS-
dc.subjectRF DISCHARGES-
dc.subjectPRESSURE-
dc.subjectEMISSION-
dc.subjectFREQUENCY-
dc.subjectPLASMA-
dc.subjectAIR-
dc.titleParticle-in-cell simulation of gas breakdown in microgaps-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1088/0022-3727/38/6/027-
dc.author.googleRadmilovic-Radjenovic, M-
dc.author.googleLee, JK-
dc.author.googleIza, F-
dc.author.googlePark, GY-
dc.relation.volume38-
dc.relation.issue6-
dc.relation.startpage950-
dc.relation.lastpage954-
dc.contributor.id10158178-
dc.relation.journalJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.38, no.6, pp.950 - 954-
dc.identifier.wosid000229302700028-
dc.date.tcdate2019-02-01-
dc.citation.endPage954-
dc.citation.number6-
dc.citation.startPage950-
dc.citation.titleJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.citation.volume38-
dc.contributor.affiliatedAuthorLee, JK-
dc.identifier.scopusid2-s2.0-15744371656-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc94-
dc.type.docTypeArticle-
dc.subject.keywordPlusELECTRIC-FIELD BREAKDOWN-
dc.subject.keywordPlusEMISSION-
dc.subject.keywordPlusPLASMA-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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