DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, SK | - |
dc.contributor.author | Park, SJ | - |
dc.contributor.author | Park, HJ | - |
dc.contributor.author | Sim, JY | - |
dc.date.accessioned | 2016-04-01T02:21:16Z | - |
dc.date.available | 2016-04-01T02:21:16Z | - |
dc.date.created | 2011-03-28 | - |
dc.date.issued | 2011-03 | - |
dc.identifier.issn | 0018-9200 | - |
dc.identifier.other | 2011-OAK-0000023104 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/24969 | - |
dc.description.abstract | This paper presents a 100 kS/s, 1.3 mu W, 9.3 ENOB successive approximation ADC with a time-domain comparator. The proposed time-domain comparator utilizes a differential multi-stage VCDL, resulting in a highly digital operation eliminating static power consumption. The effects of gain, noise, and offset are also investigated by detailed analysis which proves the feature of reducing the input-referred noise and offset by simply increasing the number of delay stages. For verification, the proposed ADC is fabricated in a 0.18 mu m CMOS. With a single supply voltage of 0.6 V, the ADC consumes 1.3 mu W at the maximum sampling rate of 100 kS/s. The measured ENOB is 9.3 b showing a figure of merit of 21 fJ/conversion-step. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - |
dc.title | A 21 fJ/Conversion-Step 100 kS/s 10-bit ADC With a Low-Noise Time-Domain Comparator for Low-Power Sensor Interface | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1109/JSSC.2010.2102590 | - |
dc.author.google | Lee, SK | - |
dc.author.google | Park, SJ | - |
dc.author.google | Park, HJ | - |
dc.author.google | Sim, JY | - |
dc.relation.volume | 46 | - |
dc.relation.issue | 3 | - |
dc.relation.startpage | 651 | - |
dc.relation.lastpage | 659 | - |
dc.contributor.id | 10100874 | - |
dc.relation.journal | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.46, no.3, pp.651 - 659 | - |
dc.identifier.wosid | 000287661500009 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 659 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 651 | - |
dc.citation.title | IEEE JOURNAL OF SOLID-STATE CIRCUITS | - |
dc.citation.volume | 46 | - |
dc.contributor.affiliatedAuthor | Lee, SK | - |
dc.contributor.affiliatedAuthor | Park, HJ | - |
dc.contributor.affiliatedAuthor | Sim, JY | - |
dc.identifier.scopusid | 2-s2.0-79952071655 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 75 | - |
dc.description.scptc | 85 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.description.isOpenAccess | N | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Analog-to-digital converter | - |
dc.subject.keywordAuthor | comparator | - |
dc.subject.keywordAuthor | successive approximation ADC | - |
dc.subject.keywordAuthor | sensor interface | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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