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Cited 7 time in webofscience Cited 6 time in scopus
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A New Control Scheme Always Better Than X-Bar Chart SCIE SCOPUS

Title
A New Control Scheme Always Better Than X-Bar Chart
Authors
Lee, SHJun, CH
Date Issued
2010-01
Publisher
TAYLOR & FRANCIS INC
Abstract
A new control scheme is proposed by borrowing the idea of the Benjamini-Hochberg procedure for controlling the false discovery rate in multiple testing. It is shown theoretically that the proposed 2-span control scheme outperforms the Shewhart X-bar chart in terms of the average run length under any size of mean shifts. Some simulations are carried out to demonstrate that the proposed scheme having various span sizes always outperforms the X-bar chart in terms of the average run lengths.
Keywords
Average run length; Mean shift; Multiple testing; P-value; Quality control; DISTRIBUTIONS
URI
https://oasis.postech.ac.kr/handle/2014.oak/25391
DOI
10.1080/03610920903243744
ISSN
0361-0926
Article Type
Article
Citation
COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, vol. 39, no. 19, page. 3492 - 3503, 2010-01
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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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