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Cited 34 time in webofscience Cited 38 time in scopus
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dc.contributor.authorJun, CH-
dc.contributor.authorLee, H-
dc.contributor.authorLee, SH-
dc.contributor.authorBalamurali, S-
dc.date.accessioned2016-04-01T02:34:52Z-
dc.date.available2016-04-01T02:34:52Z-
dc.date.created2010-12-06-
dc.date.issued2010-01-
dc.identifier.issn0266-4763-
dc.identifier.other2010-OAK-0000022287-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/25394-
dc.description.abstractWe propose a variables repetitive group sampling plan under type-II or failure-censored life testing when the lifetime of a part follows a Weibull distribution with a known shape parameter. The acceptance criteria do not involve unknown scale parameter differently from the existing plans. To determine the design parameters of the proposed plan, the usual approach of using two points on the operating characteristic curve is adopted and an optimization problem is formulated so as to minimize the average number of failures observed. Tables for design parameters are constructed when the quality of parts is represented by the unreliability or the ratio of the mean lifetime to the specified life. It is found that the proposed sampling plan can reduce the sample size significantly than do the single sampling plan.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisher"ROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD"-
dc.relation.isPartOfJOURNAL OF APPLIED STATISTICS-
dc.subjectacceptance sampling-
dc.subjectconsumer&apos-
dc.subjects risk-
dc.subjectfailure censoring-
dc.subjectOC curve-
dc.subjectproducer&apos-
dc.subjects risk-
dc.subjectprogressive censoring-
dc.titleA variables repetitive group sampling plan under failure-censored reliability tests for Weibull distribution-
dc.typeArticle-
dc.contributor.college산업경영공학과-
dc.identifier.doi10.1080/02664760802715914-
dc.author.googleJun, Chi-Hyuck-
dc.author.googleLee, Hyeseon-
dc.author.googleLee, Sang-Ho-
dc.author.googleBalamurali, S.-
dc.relation.volume37-
dc.relation.issue3-
dc.relation.startpage453-
dc.relation.lastpage460-
dc.contributor.id10070938-
dc.relation.journalJOURNAL OF APPLIED STATISTICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCIE-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED STATISTICS, v.37, no.3, pp.453 - 460-
dc.identifier.wosid000275111500008-
dc.date.tcdate2019-02-01-
dc.citation.endPage460-
dc.citation.number3-
dc.citation.startPage453-
dc.citation.titleJOURNAL OF APPLIED STATISTICS-
dc.citation.volume37-
dc.contributor.affiliatedAuthorJun, CH-
dc.identifier.scopusid2-s2.0-77649108635-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc14-
dc.description.scptc12*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthoracceptance sampling-
dc.subject.keywordAuthorconsumer&apos-
dc.subject.keywordAuthors risk-
dc.subject.keywordAuthorfailure censoring-
dc.subject.keywordAuthorOC curve-
dc.subject.keywordAuthorproducer&apos-
dc.subject.keywordAuthors risk-
dc.subject.keywordAuthorprogressive censoring-
dc.relation.journalWebOfScienceCategoryStatistics & Probability-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMathematics-

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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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