A double acceptance sampling plan for generalized log-logistic distributions with known shape parameters
SCIE
SCOPUS
- Title
- A double acceptance sampling plan for generalized log-logistic distributions with known shape parameters
- Authors
- Aslam, M; Jun, CH
- Date Issued
- 2010-01
- Publisher
- "ROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD"
- Abstract
- A double acceptance sampling plan for the truncated life test is developed assuming that the lifetime of a product follows a generalized log-logistic distribution with known shape parameters. The zero and one failure scheme is mainly considered, where the lot is accepted if no failures are observed from the first sample and it is rejected if two or more failures occur. When there is one failure from the first sample, the second sample is drawn and tested for the same duration as the first sample. The minimum sample sizes of the first and second samples are determined to ensure that the true median life is longer than the given life at the specified consumer's confidence level. The operating characteristics are analyzed according to various ratios of the true median life to the specified life. The minimum such ratios are also obtained so as to lower the producer's risk at the specified level. The results are explained with examples.
- Keywords
- consumer' s confidence; double acceptance sampling; log-logistic distribution; producer' s risk; single acceptance sampling; TRUNCATED LIFE TESTS; MODEL
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/25395
- DOI
- 10.1080/02664760802698979
- ISSN
- 0266-4763
- Article Type
- Article
- Citation
- JOURNAL OF APPLIED STATISTICS, vol. 37, no. 3, page. 405 - 414, 2010-01
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