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High T-g Cyclic Olefin Copolymer Gate Dielectrics for N,N '-Ditridecyl Perylene Diimide Based Field-Effect Transistors: Improving Performance and Stability with Thermal Treatment SCIE SCOPUS

Title
High T-g Cyclic Olefin Copolymer Gate Dielectrics for N,N '-Ditridecyl Perylene Diimide Based Field-Effect Transistors: Improving Performance and Stability with Thermal Treatment
Authors
Jang, JNam, SChung, DSKim, SHYun, WMPark, CE
Date Issued
2010-08-23
Publisher
WILEY-V C H VERLAG GMBH
Abstract
A novel application of ethylene-norbornene cyclic olefin copolymers (COC) as gate dielectric layers in organic field-effect transistors (OFETs) that require thermal annealing as a strategy for improving the OFET performance and stability is reported. The thermally-treated N,N'-ditridecyl perylene diimide (PTCDI-C13)-based n-type FETs using a COC/SiO2 gate dielectric show remarkably enhanced atmospheric performance and stability. The COC gate dielectric layer displays a hydrophobic surface (water contact angle = 95 degrees +/- 1 degrees) and high thermal stability (glass transition temperature = 181 degrees C) without producing crosslinking. After thermal annealing, the crystallinity improves and the grain size of PTCDI-C13 domains grown on the COC/SiO2 gate dielectric increases significantly. The resulting n-type FETs exhibit high atmospheric field-effect mobilities, up to 0.90 cm(2) V-1 s(-1) in the 20 V saturation regime and long-term stability with respect to H2O/O-2 degradation, hysteresis, or sweep-stress over 110 days. By integrating the n-type FETs with p-type pentacene-based FETs in a single device, high performance organic complementary inverters that exhibit high gain (exceeding 45 in ambient air) are realized.
Keywords
THIN-FILM TRANSISTORS; COMPLEMENTARY INVERTERS; ORGANIC SEMICONDUCTORS; LARGE-AREA; PENTACENE; MOBILITY; POLYMER; NORBORNENE; CIRCUITS; ETHYLENE
URI
https://oasis.postech.ac.kr/handle/2014.oak/25718
DOI
10.1002/ADFM.201000383
ISSN
1616-301X
Article Type
Article
Citation
ADVANCED FUNCTIONAL MATERIALS, vol. 20, no. 16, page. 2611 - 2618, 2010-08-23
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박찬언PARK, CHAN EON
Dept. of Chemical Enginrg
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