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dc.contributor.authorKim, SK-
dc.contributor.authorSon, JY-
dc.contributor.authorShin, YH-
dc.contributor.authorJo, MH-
dc.contributor.authorPark, S-
dc.contributor.authorHong, TE-
dc.contributor.authorYee, KJ-
dc.date.accessioned2016-04-01T02:54:44Z-
dc.date.available2016-04-01T02:54:44Z-
dc.date.created2010-05-10-
dc.date.issued2010-03-01-
dc.identifier.issn0040-6090-
dc.identifier.other2010-OAK-0000021206-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/25971-
dc.description.abstractGe0.7Mn0.3 thin films were fabricated on Al2O3 (0001) and glass substrates at growth temperatures ranging from room temperature to 500 degrees C by a radio frequency magnetron sputtering. We found that the Ge0.7Mn0.3 thin films showed a polycrystalline-to-amorphous transition at about 360 degrees C, and the ferromagnetic transition temperature of each thin film depends on its structure crystalline or amorphous states. Particularly, the Ge0.7Mn0.3 thin films showed room temperature ferromagnetism when they were fabricated at temperatures above the crystallization temperature. (C) 2009 Elsevier B.V. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.relation.isPartOfTHIN SOLID FILMS-
dc.subjectSemiconductors-
dc.subjectDeposition process-
dc.subjectSputtering-
dc.subjectMagnetic properties and measurements-
dc.subjectSINGLE-CRYSTALS-
dc.subjectFERROMAGNETIC SEMICONDUCTOR-
dc.subjectTEMPERATURE FERROMAGNETISM-
dc.subjectPRECIPITATION-
dc.subjectCR-
dc.titleStructural and magnetic properties of Ge0.7Mn0.3 thin films-
dc.typeArticle-
dc.contributor.college첨단재료과학부-
dc.identifier.doi10.1016/J.TSF.2009.08.031-
dc.author.googleKim, Sung-Kyu-
dc.author.googleSon, Jong Yeog-
dc.author.googleShin, Young-Han-
dc.author.googleJo, Moon-Ho-
dc.author.googlePark, S.-
dc.author.googleHong, Tae Eun-
dc.author.googleYee, K. J.-
dc.relation.volume518-
dc.relation.issue10-
dc.relation.startpage2665-
dc.relation.lastpage2668-
dc.contributor.id10176415-
dc.relation.journalTHIN SOLID FILMS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationTHIN SOLID FILMS, v.518, no.10, pp.2665 - 2668-
dc.identifier.wosid000275920000015-
dc.date.tcdate2018-03-23-
dc.citation.endPage2668-
dc.citation.number10-
dc.citation.startPage2665-
dc.citation.titleTHIN SOLID FILMS-
dc.citation.volume518-
dc.contributor.affiliatedAuthorJo, MH-
dc.identifier.scopusid2-s2.0-76249114329-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.scptc0*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordPlusSINGLE-CRYSTALS-
dc.subject.keywordPlusFERROMAGNETIC SEMICONDUCTOR-
dc.subject.keywordPlusTEMPERATURE FERROMAGNETISM-
dc.subject.keywordPlusPRECIPITATION-
dc.subject.keywordPlusCR-
dc.subject.keywordAuthorSemiconductors-
dc.subject.keywordAuthorDeposition process-
dc.subject.keywordAuthorSputtering-
dc.subject.keywordAuthorMagnetic properties and measurements-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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조문호JO, MOON HO
Dept of Materials Science & Enginrg
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