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Cited 13 time in webofscience Cited 12 time in scopus
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dc.contributor.authorHa, H-
dc.contributor.authorKim, O-
dc.date.accessioned2016-04-01T03:04:06Z-
dc.date.available2016-04-01T03:04:06Z-
dc.date.created2010-04-28-
dc.date.issued2009-04-
dc.identifier.issn0021-4922-
dc.identifier.other2009-OAK-0000020806-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/26210-
dc.description.abstractThis paper describes the fabrication and electric characteristics of nonvolatile memory devices from a poly(3,4-ethylenedioxythiophene): poly(styrene sulfonate) (PEDOT:PSS) thin film sandwiched between two Al electrodes. These devices have unipolar switching behavior. The on and off voltages are about 2-3 and 0.5 V, respectively. The on/off current ratio of the device is 10(4)-10(9). Also, the write-erase cycle test was operated 27 times and the retention time was up to 6h. These characteristics were affected by several factors, such as the formation of current paths due to the redox behavior of PEDOT:PSS chain, the application of the compliance current and the existence of the native thin oxide layer, Al2O3, on top of the At bottom electrode. (C) 2009 The Japan Society of Applied Physics-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherINST PURE APPLIED PHYSICS-
dc.relation.isPartOfJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.subjectELECTRICAL BISTABILITY-
dc.subjectPOLYMER-
dc.subjectSYSTEM-
dc.titleUnipolar Switching Characteristics of Nonvolatile Memory Devices Based on Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonate) Thin Films-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1143/JJAP.48.04C169-
dc.author.googleHa, H-
dc.author.googleKim, O-
dc.relation.volume48-
dc.relation.issue4-
dc.relation.startpage04C169-
dc.contributor.id10087230-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameConference Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.48, no.4, pp.4C169-
dc.identifier.wosid000265652700170-
dc.date.tcdate2019-02-01-
dc.citation.number4-
dc.citation.startPage4C169-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.volume48-
dc.contributor.affiliatedAuthorKim, O-
dc.identifier.scopusid2-s2.0-77950081652-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc11-
dc.description.scptc7*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusELECTRICAL BISTABILITY-
dc.subject.keywordPlusPOLYMER-
dc.subject.keywordPlusSYSTEM-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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김오현KIM, OHYUN
Dept of Electrical Enginrg
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