DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, JH | - |
dc.contributor.author | Kim, HS | - |
dc.contributor.author | Hwang, HN | - |
dc.contributor.author | Kim, B | - |
dc.contributor.author | Chung, S | - |
dc.contributor.author | Chung, JW | - |
dc.contributor.author | Hwang, CC | - |
dc.date.accessioned | 2016-04-01T03:12:01Z | - |
dc.date.available | 2016-04-01T03:12:01Z | - |
dc.date.created | 2010-04-14 | - |
dc.date.issued | 2009-12 | - |
dc.identifier.issn | 1098-0121 | - |
dc.identifier.other | 2010-OAK-0000020533 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/26380 | - |
dc.description.abstract | We have investigated atomic structure and electrical properties of the Au/Si(557)-1x2 surface by using scanning tunneling microscopy. We observe the doubled periodicity (x2) for the step-edge atoms even far away from defects at room temperature (RT), indicating no Peierls-type transition reported earlier. We further identify the Au atoms well resolved from Si atoms in the Au-Si-Au chain at RT, in good accord with the prevailing structural model. Our scanning tunneling spectroscopy data taken along the step-edge atoms unambiguously reveal that these step-edge Si atoms are metallic, and are buckled apparently with a charge transferred from down to up Si atoms. We find no significant thermal fluctuation of the buckled step edges at RT. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | AMER PHYSICAL SOC | - |
dc.relation.isPartOf | PHYSICAL REVIEW B | - |
dc.title | Direct evidence of the step-edge buckling at the Au/Si(557)-1x2 surface | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | - |
dc.identifier.doi | 10.1103/PHYSREVB.80.241401 | - |
dc.author.google | Han, JH | - |
dc.author.google | Kim, HS | - |
dc.author.google | Hwang, HN | - |
dc.author.google | Kim, B | - |
dc.author.google | Chung, S | - |
dc.author.google | Chung, JW | - |
dc.author.google | Hwang, CC | - |
dc.relation.volume | 80 | - |
dc.relation.issue | 24 | - |
dc.relation.startpage | 241401 | - |
dc.relation.lastpage | 241401 | - |
dc.contributor.id | 10071841 | - |
dc.relation.journal | PHYSICAL REVIEW B | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW B, v.80, no.24, pp.241401 - 241401 | - |
dc.identifier.wosid | 000273229200028 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 241401 | - |
dc.citation.number | 24 | - |
dc.citation.startPage | 241401 | - |
dc.citation.title | PHYSICAL REVIEW B | - |
dc.citation.volume | 80 | - |
dc.contributor.affiliatedAuthor | Chung, S | - |
dc.contributor.affiliatedAuthor | Chung, JW | - |
dc.identifier.scopusid | 2-s2.0-77954707327 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 11 | - |
dc.description.scptc | 9 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | band structure | - |
dc.subject.keywordAuthor | buckling | - |
dc.subject.keywordAuthor | charge exchange | - |
dc.subject.keywordAuthor | crystal defects | - |
dc.subject.keywordAuthor | gold | - |
dc.subject.keywordAuthor | metal-insulator transition | - |
dc.subject.keywordAuthor | Peierls instability | - |
dc.subject.keywordAuthor | scanning tunnelling microscopy | - |
dc.subject.keywordAuthor | scanning tunnelling spectroscopy | - |
dc.subject.keywordAuthor | silicon | - |
dc.subject.keywordAuthor | surface conductivity | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
library@postech.ac.kr Tel: 054-279-2548
Copyrights © by 2017 Pohang University of Science ad Technology All right reserved.