DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, K | - |
dc.contributor.author | Koch, CT | - |
dc.contributor.author | Lee, JK | - |
dc.contributor.author | Kim, DY | - |
dc.contributor.author | KIM, JONG KYU | - |
dc.contributor.author | Parvizi, A | - |
dc.contributor.author | Jung, WY | - |
dc.contributor.author | PARK, CHAN GYUNG | - |
dc.contributor.author | Jeong, HJ | - |
dc.contributor.author | KIM, HYOUNG SEOP | - |
dc.contributor.author | Cao, Y | - |
dc.contributor.author | Yang, TN | - |
dc.contributor.author | Chen, LQ | - |
dc.contributor.author | Oh, SH | - |
dc.date.accessioned | 2016-04-01T07:45:07Z | - |
dc.date.available | 2016-04-01T07:45:07Z | - |
dc.date.created | 2015-06-18 | - |
dc.date.issued | 2015-01-07 | - |
dc.identifier.issn | 2196-7350 | - |
dc.identifier.other | 2015-OAK-0000033188 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/26832 | - |
dc.description.abstract | A key to strain engineering of piezoelectric semiconductor devices is the quantitative assessment of the strain-charge relationship. This is particularly demanding in current InGaN/GaN-based light-emitting diode (LED) designs as piezoelectric effects are known to degrade the device performance. Using the state-of-the-art inline electron holography, we have obtained fully quantitative maps of the two-dimensional strain tensor and total charge density in conventional blue LEDs and correlated these with sub-nanometer spatial resolution. We show that the In0.15Ga0.85N quantum wells are compressively strained and elongated along the polar growth direction, exerting compressive stress/strain on the GaN quantum barriers. Interface sheet charges arising from a polarization gradient are obtained directly from the strain data and compared with the total charge density map, quantitatively verifying only 60% of the polarization charges are screened by electrons, leaving a substantial piezoelectric field in each In0.15Ga0.85N quantum well. The demonstrated capability of inline electron holography provides a technical breakthrough for future strain engineering of piezoelectric optoelectronic devices. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | WILEY-BLACKWELL | - |
dc.relation.isPartOf | ADVANCED MATERIALS INTERFACES | - |
dc.title | Correlative High-Resolution Mapping of Strain and Charge Density in a Strained Piezoelectric Multilayer | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1002/ADMI.201400281 | - |
dc.author.google | Song, K | - |
dc.author.google | Koch, CT | - |
dc.author.google | Lee, JK | - |
dc.author.google | Kim, DY | - |
dc.author.google | Kim, JK | - |
dc.author.google | Parvizi, A | - |
dc.author.google | Jung, WY | - |
dc.author.google | Park, CG | - |
dc.author.google | Jeong, HJ | - |
dc.author.google | Kim, HS | - |
dc.author.google | Cao, Y | - |
dc.author.google | Yang, TN | - |
dc.author.google | Chen, LQ | - |
dc.author.google | Oh, SH | - |
dc.relation.volume | 2 | - |
dc.relation.issue | 1 | - |
dc.contributor.id | 10056225 | - |
dc.relation.journal | ADVANCED MATERIALS INTERFACES | - |
dc.relation.sci | SCIE | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | ADVANCED MATERIALS INTERFACES, v.2, no.1 | - |
dc.identifier.wosid | 000348287200005 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.number | 1 | - |
dc.citation.title | ADVANCED MATERIALS INTERFACES | - |
dc.citation.volume | 2 | - |
dc.contributor.affiliatedAuthor | KIM, JONG KYU | - |
dc.contributor.affiliatedAuthor | PARK, CHAN GYUNG | - |
dc.contributor.affiliatedAuthor | KIM, HYOUNG SEOP | - |
dc.contributor.affiliatedAuthor | Oh, SH | - |
dc.identifier.scopusid | 2-s2.0-84938571770 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 10 | - |
dc.description.scptc | 8 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | LIGHT-EMITTING-DIODES | - |
dc.subject.keywordPlus | ELECTRON HOLOGRAPHY | - |
dc.subject.keywordPlus | MACROSCOPIC POLARIZATION | - |
dc.subject.keywordPlus | NANOWIRE ARRAYS | - |
dc.subject.keywordPlus | QUANTUM-WELLS | - |
dc.subject.keywordPlus | GAN | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | SINGLE | - |
dc.subject.keywordPlus | FIELDS | - |
dc.subject.keywordPlus | RECONSTRUCTION | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
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