Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy
SCIE
SCOPUS
- Title
- Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy
- Authors
- Moon, K; Park, H; Kim, J; Do, Y; Lee, S; Lee, G; Kang, H; Han, H
- Date Issued
- 2015-01
- Publisher
- AMER CHEMICAL SOC
- Abstract
- Combined with terahertz (THz) time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the subsurface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to similar to lambda/3300, at 1 THz, while the AFM only provides a flat surface topography.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/27037
- DOI
- 10.1021/NL503998V
- ISSN
- 1530-6984
- Article Type
- Article
- Citation
- NANO LETTERS, vol. 15, no. 1, page. 549 - 552, 2015-01
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