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Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy SCIE SCOPUS

Title
Subsurface Nanoimaging by Broadband Terahertz Pulse Near-Field Microscopy
Authors
Moon, KPark, HKim, JDo, YLee, SLee, GKang, HHan, H
Date Issued
2015-01
Publisher
AMER CHEMICAL SOC
Abstract
Combined with terahertz (THz) time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging of a metallic grating embedded in a dielectric film. The THz near-field microscope can obtain broadband nanoimaging of the subsurface grating with a nearly frequency-independent lateral resolution of 90 nm, corresponding to similar to lambda/3300, at 1 THz, while the AFM only provides a flat surface topography.
URI
https://oasis.postech.ac.kr/handle/2014.oak/27037
DOI
10.1021/NL503998V
ISSN
1530-6984
Article Type
Article
Citation
NANO LETTERS, vol. 15, no. 1, page. 549 - 552, 2015-01
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