A control chart for an exponential distribution using multiple dependent state sampling

Abstract

In this paper, we will present a control chart for exponentially distributed quality characteristics using multiple dependent state sampling. The proposed control chart has double control limits with two control coefficients, which is based on a normal approximation through transformation. The control coefficients are determined by considering the average run length (ARL) when the process is in control. The ARL for the shifted process is reported according to various shift ratios. The efficiency of the proposed control chart over the existing t-chart is compared in terms of the ARL.