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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | ROBERTSON, WM | - |
| dc.contributor.author | ARJAVALINGAM, G | - |
| dc.contributor.author | HOUGHAM, G | - |
| dc.contributor.author | KOPCSAY, GV | - |
| dc.contributor.author | EDELSTEIN, D | - |
| dc.contributor.author | REE, MH | - |
| dc.contributor.author | CHAPPLESOKOL, JD | - |
| dc.date.accessioned | 2016-04-01T08:24:50Z | - |
| dc.date.available | 2016-04-01T08:24:50Z | - |
| dc.date.created | 2009-10-07 | - |
| dc.date.issued | 1992-01-02 | - |
| dc.identifier.issn | 0013-5194 | - |
| dc.identifier.other | 1992-OAK-0000019128 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/27916 | - |
| dc.description.abstract | Measurement of the broadband (15-150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (approximately 200-mu-m thick) polymer films are presented. | - |
| dc.description.statementofresponsibility | X | - |
| dc.language | English | - |
| dc.publisher | IEE-INST ELEC ENG | - |
| dc.relation.isPartOf | ELECTRONICS LETTERS | - |
| dc.title | MICROWAVE PROPERTIES OF FREESTANDING DIELECTRIC FILMS | - |
| dc.type | Article | - |
| dc.contributor.college | 화학과 | - |
| dc.identifier.doi | 10.1049/el:19920039 | - |
| dc.author.google | ROBERTSON, WM | - |
| dc.author.google | ARJAVALINGAM, G | - |
| dc.author.google | HOUGHAM, G | - |
| dc.author.google | KOPCSAY, GV | - |
| dc.author.google | EDELSTEIN, D | - |
| dc.author.google | REE, MH | - |
| dc.author.google | CHAPPLESOKOL, JD | - |
| dc.relation.volume | 28 | - |
| dc.relation.issue | 1 | - |
| dc.relation.startpage | 62 | - |
| dc.relation.lastpage | 63 | - |
| dc.contributor.id | 10115761 | - |
| dc.relation.journal | ELECTRONICS LETTERS | - |
| dc.relation.index | SCI급, SCOPUS 등재논문 | - |
| dc.relation.sci | SCI | - |
| dc.collections.name | Journal Papers | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | ELECTRONICS LETTERS, v.28, no.1, pp.62 - 63 | - |
| dc.identifier.wosid | A1992HA18400039 | - |
| dc.date.tcdate | 2019-02-01 | - |
| dc.citation.endPage | 63 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 62 | - |
| dc.citation.title | ELECTRONICS LETTERS | - |
| dc.citation.volume | 28 | - |
| dc.contributor.affiliatedAuthor | REE, MH | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.description.wostc | 16 | - |
| dc.type.docType | Article | - |
| dc.subject.keywordAuthor | DIELECTRICS AND DIELECTRIC DEVICES | - |
| dc.subject.keywordAuthor | MICROWAVE MEASUREMENT | - |
| dc.subject.keywordAuthor | SPECTROSCOPY | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
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- 이문호REE, MOONHOR
- Dept of Chemistry