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Cited 18 time in webofscience Cited 24 time in scopus
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dc.contributor.authorSim, JY-
dc.contributor.authorYoon, H-
dc.contributor.authorChun, KC-
dc.contributor.authorLee, HS-
dc.contributor.authorHong, SP-
dc.contributor.authorLee, KC-
dc.contributor.authorYoo, JH-
dc.contributor.authorSeo, DI-
dc.contributor.authorCho, SI-
dc.date.accessioned2016-04-01T08:25:57Z-
dc.date.available2016-04-01T08:25:57Z-
dc.date.created2009-10-08-
dc.date.issued2003-04-
dc.identifier.issn0018-9200-
dc.identifier.other2003-OAK-0000019076-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/27958-
dc.description.abstractTo verify three important circuit schemes suitable for DRAMs in mobile applications, a 1.8-V 128-Mb SDRAM was implemented with a 0.15-mum technology. To achieve an ideal 33% efficiency,, the double boosting pump uses two capacitor's series connection at pumping phase, while they are precharged in parallel. The hybrid folded current sense amplifier together with a novel replica inverter connection improved power and speed performances. Also, a dual-referenced adjustment scheme for a temperature sensor was proposed to allow a very high accuracy in tuning. Without loss in productivity, the implemented dual-referenced searching technique achieved tuning error of less than 2.5 degreesC.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.subjectcharge pump-
dc.subjectDRAM-
dc.subjectsense amplifier-
dc.subjecttemperature sensor-
dc.subjectCIRCUITS-
dc.titleA. 1.8-V 128-Mb mobile DRAM with double boosting pump, hybrid current sense amplifier, and dual-referenced adjustment scheme for temperature sensor-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/JSSC.2003.809514-
dc.author.googleSim, JY-
dc.author.googleYoon, H-
dc.author.googleChun, KC-
dc.author.googleLee, HS-
dc.author.googleHong, SP-
dc.author.googleLee, KC-
dc.author.googleYoo, JH-
dc.author.googleSeo, DI-
dc.author.googleCho, SI-
dc.relation.volume38-
dc.relation.issue4-
dc.relation.startpage631-
dc.relation.lastpage640-
dc.contributor.id10100874-
dc.relation.journalIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.38, no.4, pp.631 - 640-
dc.identifier.wosid000181838300007-
dc.date.tcdate2019-02-01-
dc.citation.endPage640-
dc.citation.number4-
dc.citation.startPage631-
dc.citation.titleIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.volume38-
dc.contributor.affiliatedAuthorSim, JY-
dc.identifier.scopusid2-s2.0-0344089098-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc15-
dc.description.scptc19*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorcharge pump-
dc.subject.keywordAuthorDRAM-
dc.subject.keywordAuthorsense amplifier-
dc.subject.keywordAuthortemperature sensor-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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