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dc.contributor.authorKim, KH-
dc.contributor.authorChang, CH-
dc.contributor.authorKoo, YM-
dc.date.accessioned2016-04-01T08:59:36Z-
dc.date.available2016-04-01T08:59:36Z-
dc.date.created2009-03-05-
dc.date.issued1997-09-01-
dc.identifier.issn0261-8028-
dc.identifier.other1997-OAK-0000011169-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/29216-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherCHAPMAN HALL LTD-
dc.relation.isPartOfJOURNAL OF MATERIALS SCIENCE LETTERS-
dc.subjectX-RAY-DIFFRACTION-
dc.subjectSAPPHIRE-
dc.titleA structural characterization of AlN thin film deposited on a single crystal Al2O3(0001) substrate-
dc.typeArticle-
dc.contributor.college철강대학원-
dc.identifier.doi10.1023/A:1018542217877-
dc.author.googleKIM, KH-
dc.author.googleCHANG, CH-
dc.author.googleKOO, YM-
dc.relation.volume16-
dc.relation.issue17-
dc.relation.startpage1457-
dc.relation.lastpage1459-
dc.contributor.id10052553-
dc.relation.journalJOURNAL OF MATERIALS SCIENCE LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE LETTERS, v.16, no.17, pp.1457 - 1459-
dc.identifier.wosidA1997XW09300013-
dc.date.tcdate2018-03-23-
dc.citation.endPage1459-
dc.citation.number17-
dc.citation.startPage1457-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE LETTERS-
dc.citation.volume16-
dc.contributor.affiliatedAuthorKoo, YM-
dc.identifier.scopusid2-s2.0-0031233096-
dc.description.journalClass1-
dc.description.journalClass1-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-

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구양모KOO, YANG MO
Ferrous & Energy Materials Technology
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