PROPERTIES OF CO/PD MULTILAYERS PREPARED BY UHV PHYSICAL VAPOR-DEPOSITION

Abstract

Co/Pd multilayer films with a few atomic layers of Co were prepared on Si wafers by alternating deposition in an ultrahigh-vacuum physical vapor deposition system. The ultrathin structural parameters were measured accurately using only the angular positions of the X-ray diffraction peaks. The magnetic and magneto-optical properties were found to vary greatly depending on Pd predeposition and Pd sublayer thicknesses as well as Co sublayer thickness. The Pd-predeposited films were found to have a remarkably high coercivity of 4723 Oe and an interfacial magnetic anisotropy of 0.72 mJ/m2, which indicates their excellent potential as magneto-optical recording media.