Microdiffraction study of polycrystalline copper during uniaxial tension deformation using a synchrotron x-ray source
SCIE
SCOPUS
- Title
- Microdiffraction study of polycrystalline copper during uniaxial tension deformation using a synchrotron x-ray source
- Authors
- Joo, HD; Kim, JS; Bark, CW; Kim, JY; Koo, YM; Tamura, N
- Date Issued
- 2005-01
- Publisher
- TRANS TECH PUBLICATIONS LTD
- Abstract
- In-situ measurement of local orientation and strain Has Been carried out for a copper-polycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.
- Keywords
- microdiffraction; tensile axis rotation; polycrystal; local deformation; slip system
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/29648
- DOI
- 10.4028/www.scientific.net/MSF.475-479.4149
- ISSN
- 0255-5476
- Article Type
- Article
- Citation
- MATERIALS SCIENCE FORUM, vol. 475-479, page. 4149 - 4152, 2005-01
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- There are no files associated with this item.
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