Open Access System for Information Sharing

Login Library

 

Article
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
There are no files associated with this item.
DC FieldValueLanguage
dc.contributor.author허병국-
dc.contributor.author이희석-
dc.contributor.author신남수-
dc.contributor.author김재성-
dc.contributor.author구양모-
dc.date.accessioned2017-07-18T12:29:18Z-
dc.date.available2017-07-18T12:29:18Z-
dc.date.created2009-03-26-
dc.date.issued2002-01-
dc.identifier.issn0253-3847-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/30152-
dc.languageKorean-
dc.publisher대한금속재료학회 ( 구 대한금속학회 )-
dc.relation.isPartOf대한금속·재료학회지-
dc.title방사광을 이용한 전반사 형광 X-선 분석시 실리콘 웨이퍼의 결정방향에 대한 배경강도 의존성 연구-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.bibliographicCitation대한금속·재료학회지, v.40, no.5, pp.545 - 549-
dc.citation.endPage549-
dc.citation.number5-
dc.citation.startPage545-
dc.citation.title대한금속·재료학회지-
dc.citation.volume40-
dc.contributor.affiliatedAuthor구양모-
dc.description.journalClass2-
dc.description.journalClass2-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

구양모KOO, YANG MO
Ferrous & Energy Materials Technology
Read more

Views & Downloads

Browse