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변동계수를 이용한 반도체 결점 클러스터지표 개발 및 수율예측
- Title
- 변동계수를 이용한 반도체 결점 클러스터지표 개발 및 수율예측
- POSTECH Authors
- 전치혁
- Date Issued
- 1995-01
- Publisher
- 대한산업공학회
- ISSN
- 1225-0988
- Article Type
- Article
- Citation
- 대한산업공학회지, vol. 21, no. 3, page. 371 - 385, 1995-01
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Related Researcher
- 전치혁JUN, CHI HYUCK
- Dept of Industrial & Management Enginrg