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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | RENAUD L | - |
| dc.contributor.author | MARTIN I | - |
| dc.contributor.author | HILLION F | - |
| dc.contributor.author | HORREARD F | - |
| dc.contributor.author | YANG Y.S | - |
| dc.contributor.author | KANG J.S | - |
| dc.contributor.author | PARK C.G. | - |
| dc.date.accessioned | 2017-07-18T17:10:52Z | - |
| dc.date.available | 2017-07-18T17:10:52Z | - |
| dc.date.created | 2009-08-21 | - |
| dc.date.issued | 2008-01 | - |
| dc.identifier.issn | 1431-9276 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/31205 | - |
| dc.language | English | - |
| dc.publisher | . | - |
| dc.relation.isPartOf | MICROSCOPY AND MICROANALYSIS | - |
| dc.title | 3D ATOM PROBE AND SIMS AS COMPLEMENTARY TECHNIQUES FOR THE OBSERVATION AND QUANTITATIVE MEASUREMENT OF MICROSTRUCTURES | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1017/S14319276080 | - |
| dc.type.rims | ART | - |
| dc.identifier.bibliographicCitation | MICROSCOPY AND MICROANALYSIS, v.14, pp.1232 - 1233 | - |
| dc.citation.endPage | 1233 | - |
| dc.citation.startPage | 1232 | - |
| dc.citation.title | MICROSCOPY AND MICROANALYSIS | - |
| dc.citation.volume | 14 | - |
| dc.contributor.affiliatedAuthor | PARK C.G. | - |
| dc.identifier.scopusid | 2-s2.0-49549125419 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
| dc.type.docType | CONFERENCE PAPER | - |
| dc.description.journalRegisteredClass | scopus | - |
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- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg