DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bark C.W | - |
dc.contributor.author | Ryu S | - |
dc.contributor.author | Koo Y.M | - |
dc.contributor.author | Jang H.M. | - |
dc.date.accessioned | 2017-07-19T00:55:11Z | - |
dc.date.available | 2017-07-19T00:55:11Z | - |
dc.date.created | 2009-09-01 | - |
dc.date.issued | 2007-01 | - |
dc.identifier.issn | 1022-6680 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/31408 | - |
dc.description.abstract | This time, we would like to report our recent study on Pb(ZrTi)O 3(PZT)-based ferroelectrics, currently one of interesting topics in condensed matter science. In this study, a new method, called synchrotron X-ray microdiffraction (XRMD) in situ, was introduced to examine the electric field-induced structural modulation of the epitaxially grown tetragonal PZT thin film. To evaluate the d-spacing (d001) from the measured intensity contour in the two theta-chi space, the peak position in each diffraction profile was determined by applying the two-dimensional Lorentzian fitting. By tracing the change of d-spacing as a function of the applied electric field and by examining the Landau free energy function for P4mm symmetry, we were able to estimate the two important parameters that characterize the field-induced structural modulation. Further theoretical analysis shows that the compressive epitaxial in-plane stress dominantly contributes to the elongation of the c-axis lattice constant in the c-axis oriented epitaxial PZT film. | - |
dc.language | English | - |
dc.publisher | TRANS TECH PUBLICATIONS, SWITZERLAND | - |
dc.relation.isPartOf | ADVANCED MATERIALS RESEARCH | - |
dc.title | Electric Field-Induced Structural Modulation of Epitaxial PbZrTiO3 Ferroelectric Thin Films as Studied Using X-Ray Microdiffraction | - |
dc.type | Article | - |
dc.identifier.doi | 10.4028/www.scientific.net/AMR.26-28.1079 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | ADVANCED MATERIALS RESEARCH, v.24-25, pp.1079 - 1082 | - |
dc.identifier.wosid | 000277260000253 | - |
dc.citation.endPage | 1082 | - |
dc.citation.startPage | 1079 | - |
dc.citation.title | ADVANCED MATERIALS RESEARCH | - |
dc.citation.volume | 24-25 | - |
dc.contributor.affiliatedAuthor | Koo Y.M | - |
dc.contributor.affiliatedAuthor | Jang H.M. | - |
dc.identifier.scopusid | 2-s2.0-57649085435 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Proceedings Paper | - |
dc.subject.keywordAuthor | X-ray microdiffraction | - |
dc.subject.keywordAuthor | epitaxial PrZrTiO3 thin film | - |
dc.subject.keywordAuthor | lattice constant | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
library@postech.ac.kr Tel: 054-279-2548
Copyrights © by 2017 Pohang University of Science ad Technology All right reserved.