DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, HJ | - |
dc.contributor.author | Lee, MK | - |
dc.contributor.author | Kim, GB | - |
dc.contributor.author | Hong, CK | - |
dc.contributor.author | Lee, JY | - |
dc.contributor.author | Kim, JW | - |
dc.contributor.author | Park, SM | - |
dc.contributor.author | Roh, YS | - |
dc.contributor.author | Jeong, K | - |
dc.date.accessioned | 2017-07-19T06:35:14Z | - |
dc.date.available | 2017-07-19T06:35:14Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2003-03 | - |
dc.identifier.issn | 1155-4339 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/33717 | - |
dc.description.abstract | A Fresnel zone plate based SPEM (scanning photoelectron microscope) is in operation at the Pohang Light Source. Space resolution of the SPEM is typically less than or similar to 1 mum (0.4 mum in the best resolution) and the photon flux at the focused spot is similar to10(9) photons/s. The SPEM is working in the energy range between 400 and 1,000 eV. In taking images and spectra, the SPEM detects photoelectrons from the focused spot using a hemispherical analyzer with 16-channel detection capability at energy resolution of similar to 0.5 eV The SPEM also measures sample current, with which comparative x-ray absorption micro-spectroscopy is available in limited energy range with spectral resolving power (E/DeltaE) of similar to 3,000. The advantage of detecting sample current image and x-ray absorption spectrum at the Fe L-III-edge is demonstrated for understanding the effect of electrochemically deposited Zn layer on Fe substrate. | - |
dc.language | English | - |
dc.publisher | E D P SCIENCES | - |
dc.relation.isPartOf | JOURNAL DE PHYSIQUE IV | - |
dc.title | A scanning photoelectron microscope for materials science spectromicroscopy at the Pohang Light Source | - |
dc.type | Article | - |
dc.identifier.doi | 10.1051/JP4:20030003 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL DE PHYSIQUE IV, v.104, pp.67 - 70 | - |
dc.identifier.wosid | 000183273900018 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 70 | - |
dc.citation.startPage | 67 | - |
dc.citation.title | JOURNAL DE PHYSIQUE IV | - |
dc.citation.volume | 104 | - |
dc.contributor.affiliatedAuthor | Hong, CK | - |
dc.contributor.affiliatedAuthor | Park, SM | - |
dc.identifier.scopusid | 2-s2.0-79952428991 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 0 | - |
dc.description.scptc | 0 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article; Proceedings Paper | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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