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결함 추출에 의한 동기 순차 회로의 시험 패턴 생성
- Title
- 결함 추출에 의한 동기 순차 회로의 시험 패턴 생성
- Authors
- 장태환.
- Date Issued
- 1995
- Publisher
- 포항공과대학교
- URI
- http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001898256
https://oasis.postech.ac.kr/handle/2014.oak/3485
- Article Type
- Thesis
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