Open Access System for Information Sharing

Login Library

 

Article
Cited 16 time in webofscience Cited 20 time in scopus
Metadata Downloads
Full metadata record
Files in This Item:
There are no files associated with this item.
DC FieldValueLanguage
dc.contributor.authorBalamurali, S-
dc.contributor.authorAslam, M-
dc.contributor.authorJun, CH-
dc.date.accessioned2017-07-19T12:11:41Z-
dc.date.available2017-07-19T12:11:41Z-
dc.date.created2016-01-06-
dc.date.issued2015-09-
dc.identifier.issn0090-3973-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/35409-
dc.description.abstractSkip-lot sampling plans are widely used in industries in order to reduce sampling costs and inspection efforts when products have a good quality history. This type of skip-lot sampling plan is economically advantageous and useful to minimize the cost of the inspection particularly with costly and destructive testing. Recently, a new type of skip-lot sampling plan called SkSP-R was developed. In this paper, an economic design of the SkSP-R plan is proposed for both destructive and non-destructive testing by considering various cost items in order to optimize the plan.-
dc.languageEnglish-
dc.publisherAMER SOC TESTING MATERIALS-
dc.relation.isPartOfJOURNAL OF TESTING AND EVALUATION-
dc.titleEconomic Design of SkSP-R Skip-Lot Sampling Plan-
dc.typeArticle-
dc.identifier.doi10.1520/JTE20140081-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF TESTING AND EVALUATION, v.43, no.5-
dc.identifier.wosid000362899900023-
dc.date.tcdate2019-03-01-
dc.citation.number5-
dc.citation.titleJOURNAL OF TESTING AND EVALUATION-
dc.citation.volume43-
dc.contributor.affiliatedAuthorJun, CH-
dc.identifier.scopusid2-s2.0-84941661247-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc3-
dc.description.scptc1*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorquality control-
dc.subject.keywordAuthorskip-lot sampling-
dc.subject.keywordAuthorcost models-
dc.subject.keywordAuthordestructive testing-
dc.subject.keywordAuthornon-destructive testing-
dc.relation.journalWebOfScienceCategoryMaterials Science, Characterization & Testing-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
Read more

Views & Downloads

Browse