Attribute Control Charts for the Weibull Distribution under Truncated Life Tests

Abstract

In this article, an attribute control chart is proposed when the lifetime of a product follows a Weibull distribution, which is based on the number of failures from a truncated life test. The coefficients of the proposed control chart and the test duration are determined so that the average run length when the process is in control is close to the target value. Tables reporting the out-of-control average run lengths are given for various shift parameters. A case study is given to illustrate the proposed control chart for industrial use.