Resubmitted Sampling Inspection Plan for Exponentiated Weibull Distribution
SCIE
SCOPUS
- Title
- Resubmitted Sampling Inspection Plan for Exponentiated Weibull Distribution
- Authors
- Aslam, M; Khan, N; Ahmad, N; Jun, CH
- Date Issued
- 2015-05
- Publisher
- AMER SOC TESTING MATERIALS
- Abstract
- This paper provides a resubmitted lot inspection plan based on the truncated life test when the failure time of a product is modeled by the exponentiated Weibull distribution. The plan parameters are determined by solving the optimization problem of minimizing the average sample number while satisfying the producer's and the consumer's risks. The proposed plan was found to be more efficient than the single inspection plan when it was applied in the carbon fiber industry.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/35429
- DOI
- 10.1520/JTE20130263
- ISSN
- 0090-3973
- Article Type
- Article
- Citation
- JOURNAL OF TESTING AND EVALUATION, vol. 43, no. 3, 2015-05
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- There are no files associated with this item.
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