DC Field | Value | Language |
---|---|---|
dc.contributor.author | Haberkorn, N | - |
dc.contributor.author | Kim, J | - |
dc.contributor.author | Suarez, S | - |
dc.contributor.author | Lee, JH | - |
dc.contributor.author | Moon, SH | - |
dc.date.accessioned | 2017-07-19T12:21:05Z | - |
dc.date.available | 2017-07-19T12:21:05Z | - |
dc.date.created | 2016-02-03 | - |
dc.date.issued | 2015-12 | - |
dc.identifier.issn | 0953-2048 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/35691 | - |
dc.description.abstract | We report the influence of random point defects introduced by 3 MeV proton irradiation (doses of 0.5 x 10(16), 1 x 10(16), 2 x 10(16) and 6 x 10(16) cm(-2)) on the vortex dynamics of co-evaporated 1.3 mu m thick, GdBa2Cu3O7-delta coated conductors. Our results indicate that the inclusion of additional random point defects reduces the low field and enhances the in-field critical current densities J(c). The main in-field J(c) enhancement takes place below 40 K, which is in agreement with the expectations for pinning by random point defects. In addition, our data show a slight though clear increase in flux creep rates as a function of irradiation fluence. Maley analysis indicates that this increment can be associated with a reduction in the exponent mu characterizing the glassy behavior. | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.relation.isPartOf | SUPERCONDUCTOR SCIENCE & TECHNOLOGY | - |
dc.title | Influence of random point defects introduced by proton irradiation on the flux creep rates and magnetic field dependence of the critical current density J(c) of co-evaporated GdBa2Cu3O7-delta coated conductors | - |
dc.type | Article | - |
dc.identifier.doi | 10.1088/0953-2048/28/12/125007 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.28, no.12 | - |
dc.identifier.wosid | 000366288100016 | - |
dc.date.tcdate | 2019-03-01 | - |
dc.citation.number | 12 | - |
dc.citation.title | SUPERCONDUCTOR SCIENCE & TECHNOLOGY | - |
dc.citation.volume | 28 | - |
dc.contributor.affiliatedAuthor | Kim, J | - |
dc.identifier.scopusid | 2-s2.0-84946557131 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 9 | - |
dc.description.scptc | 7 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | BA-CU-O | - |
dc.subject.keywordPlus | COLUMNAR DEFECTS | - |
dc.subject.keywordPlus | VORTEX CREEP | - |
dc.subject.keywordPlus | CRYSTALS | - |
dc.subject.keywordAuthor | coated conductors | - |
dc.subject.keywordAuthor | vortex dynamics | - |
dc.subject.keywordAuthor | proton irradiation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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