DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zhang, JT | - |
dc.contributor.author | KIM, JEE HOON | - |
dc.contributor.author | Huefner, M | - |
dc.contributor.author | Ye, C | - |
dc.contributor.author | Kim, S | - |
dc.contributor.author | Canfield, PC | - |
dc.contributor.author | Prozorov, R | - |
dc.contributor.author | Auslaender, OM | - |
dc.contributor.author | Hoffman, JE | - |
dc.date.accessioned | 2017-07-19T12:21:09Z | - |
dc.date.available | 2017-07-19T12:21:09Z | - |
dc.date.created | 2016-02-03 | - |
dc.date.issued | 2015-10-12 | - |
dc.identifier.issn | 1098-0121 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/35694 | - |
dc.description.abstract | We use a magnetic force microscope (MFM) to investigate single-vortex pinning and penetration depth in NdFeAsO1-xFx, one of the highest-T-c iron-based superconductors. In fields up to 20 G, we observe a disordered vortex arrangement, implying that the pinning forces are stronger than the vortex-vortex interactions. We measure the typical force to depin a single vortex, F-depin similar or equal to 4.5 pN, corresponding to a critical current up to J(c) similar or equal to 7 x 10(5) A/cm(2). Furthermore, our MFM measurements allow the first local and absolute determination of the superconducting in-plane penetration depth in NdFeAsO1-x F-x, lambda(ab) = 320 +/- 60 nm, which is larger than previous bulk measurements. | - |
dc.language | English | - |
dc.publisher | AMERICAN PHYSICAL SOCIETY | - |
dc.relation.isPartOf | PHYSICAL REVIEW B | - |
dc.title | Single-vortex pinning and penetration depth in superconducting NdFeAsO1-xFx | - |
dc.type | Article | - |
dc.identifier.doi | 10.1103/PHYSREVB.92.134509 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW B, v.92, no.13, pp.134509 | - |
dc.identifier.wosid | 000362890900007 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 13 | - |
dc.citation.startPage | 134509 | - |
dc.citation.title | PHYSICAL REVIEW B | - |
dc.citation.volume | 92 | - |
dc.contributor.affiliatedAuthor | KIM, JEE HOON | - |
dc.identifier.scopusid | 2-s2.0-84944711323 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 5 | - |
dc.description.scptc | 3 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ELECTRONIC PHASE-DIAGRAM | - |
dc.subject.keywordPlus | VORTICES | - |
dc.subject.keywordPlus | SPECTROSCOPY | - |
dc.subject.keywordPlus | STATES | - |
dc.subject.keywordPlus | FORCE | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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