Upper critical magnetic field and vortex-free state in very thin epitaxial delta-MoN films grown by polymer-assisted deposition
SCIE
SCOPUS
- Title
- Upper critical magnetic field and vortex-free state in very thin epitaxial delta-MoN films grown by polymer-assisted deposition
- Authors
- Haberkorn, N; Zhang, YY; Kim, J; McCleskey, TM; Burrell, AK; Depaula, RF; Tajima, T; Jia, QX; Civale, L
- Date Issued
- 2013-10
- Publisher
- IOP PUBLISHING
- Abstract
- We measured the thickness dependence of the superconducting properties in epitaxial delta-MoN thin films grown on alpha-Al2O3(001) substrates by polymer-assisted deposition. Our results indicate that the superconducting properties such as the upper critical field (mu H-0(c2) approximate to 10 T) and the superconducting critical temperature (T-c = 12.5 K) are thickness independent for films thicker than similar to 36 nm. By measuring the critical current density (J(c)) in the vortex-free state, which coincides with the depairing current density (J(0)), we estimate that films thicker than similar to 36 nm have a coherence length xi(0) = 5.8 +/- 0.2 nm and penetration depth lambda(0) = 420 +/- 50 nm. We found that it is possible to enhance the H-c2(0) values to close to 10 T without any appreciable reduction in T-c.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/35706
- DOI
- 10.1088/0953-2048/26/10/105023
- ISSN
- 0953-2048
- Article Type
- Article
- Citation
- SUPERCONDUCTOR SCIENCE AND TECHNOLODGY, vol. 26, no. 10, 2013-10
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