DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, SY | - |
dc.contributor.author | Hong, KH | - |
dc.contributor.author | Bark, CW | - |
dc.contributor.author | Koo, YM | - |
dc.contributor.author | Kim, KY | - |
dc.contributor.author | Tak, YH | - |
dc.contributor.author | Lee, JL | - |
dc.date.accessioned | 2017-07-19T12:31:31Z | - |
dc.date.available | 2017-07-19T12:31:31Z | - |
dc.date.created | 2009-03-26 | - |
dc.date.issued | 2005-01 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/35970 | - |
dc.description.abstract | We report electroluminescence degradation in organic light emitting diode as a function of applying bias. A number of dark spots were produced as applying bias increased. Microscope image showed that dark spots are related to many protrusions and hollows formed on Al electrode. X-ray diffraction and x-ray micro-diffraction indicate that Joule heat from high electric field induced the crystallization of organic materials, forming dark spots via peeling-off the Al cathode from Alq3 layers. | - |
dc.language | English | - |
dc.publisher | INST IMAGE INFORMATION & TELEVISION ENGINEERS | - |
dc.relation.isPartOf | IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2 | - |
dc.title | Formation of dark spots induced by crystallization of organic layers in organic light-emitting diodes | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2, no.1, pp.735 - 736 | - |
dc.identifier.wosid | 000258488800188 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.endPage | 736 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 735 | - |
dc.citation.title | IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2 | - |
dc.contributor.affiliatedAuthor | Koo, YM | - |
dc.identifier.scopusid | 2-s2.0-33644600385 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Proceedings Paper | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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