An economic design of a group sampling plan for a Weibull distribution using a Bayesian approach

Abstract

In this paper, a cost model for a group sampling scheme is proposed for inspection of the lifetime of a product when the lifetime of the product follows a Weibull distribution. The optimal parameters of the group sampling plan are determined by minimizing the total cost and satisfying both the producer's risk and the consumer's risk simultaneously for the specified values of termination time, number of testers, and median ratio as the quality parameter. The application of the proposed plan is given in metrology for the inspection of chip products. We have conducted a comparative study, and it shows that the use of the proposed plan for testing the chips minimized the cost more than the existing acceptance sampling plan. Tables are provided, along with the total cost required for the life test.