DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kwak, Chang-Min | - |
dc.contributor.author | Kim, Young-Tae | - |
dc.contributor.author | Park, C.-G | - |
dc.contributor.author | SEOL, JAE BOK | - |
dc.date.accessioned | 2017-07-19T13:47:40Z | - |
dc.date.available | 2017-07-19T13:47:40Z | - |
dc.date.created | 2017-02-27 | - |
dc.date.issued | 2017-02 | - |
dc.identifier.issn | 1431-9276 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/37605 | - |
dc.language | English | - |
dc.publisher | MSA | - |
dc.relation.isPartOf | Microsc Microanal | - |
dc.title | Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy | - |
dc.type | Article | - |
dc.identifier.doi | 10.1017/S1431927617000149 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Microsc Microanal, v.23, no.2, pp.329 - 335 | - |
dc.identifier.wosid | 000405595600016 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 335 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 329 | - |
dc.citation.title | Microsc Microanal | - |
dc.citation.volume | 23 | - |
dc.contributor.affiliatedAuthor | Kwak, Chang-Min | - |
dc.contributor.affiliatedAuthor | Kim, Young-Tae | - |
dc.contributor.affiliatedAuthor | Park, C.-G | - |
dc.contributor.affiliatedAuthor | SEOL, JAE BOK | - |
dc.identifier.scopusid | 2-s2.0-85013067854 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 2 | - |
dc.description.scptc | 0 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.description.isOpenAccess | N | - |
dc.type.docType | ARTICLE | - |
dc.subject.keywordPlus | SPECIMEN PREPARATION | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | TOMOGRAPHY | - |
dc.subject.keywordPlus | STOICHIOMETRY | - |
dc.subject.keywordPlus | SEGREGATION | - |
dc.subject.keywordPlus | CARBIDES | - |
dc.subject.keywordAuthor | LaAlO3 | - |
dc.subject.keywordAuthor | metallic capping | - |
dc.subject.keywordAuthor | atom probe tomography | - |
dc.subject.keywordAuthor | transmission electron microscopy | - |
dc.subject.keywordAuthor | correlative analysis | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Microscopy | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Microscopy | - |
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