Subsurface Nanoimaging by THz Pulse Near-Field Microscopy
SCIE
SCOPUS
- Title
- Subsurface Nanoimaging by THz Pulse Near-Field Microscopy
- Authors
- Moon, K; Park, H; Kim, J; Do, Y; Lee, S; Lee, G; Kang, H; Kim, JW; Han, H
- Date Issued
- 2015-08
- Publisher
- IEEE
- Abstract
- Combined with THz time-domain spectroscopy, THz near-field microscopy based on an atomic force microscope is a technique that, while challenging to implement, is invaluable for probing low-energy light-matter interactions of solid-state and biomolecular nanostructures, which are usually embedded in background media. Here, we experimentally demonstrate a broadband THz pulse near-field microscope that provides subsurface nanoimaging with a nearly frequency-independent lateral resolution of 90 nm, corresponding to similar to lambda/3300 at 1 THz.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/37812
- DOI
- 10.1109/IRMMW-THZ.2015.7327871
- ISSN
- 2162-2027
- Article Type
- Article
- Citation
- International Conference on Infrared Millimeter and Terahertz Waves, 2015-08
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- There are no files associated with this item.
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