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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | C. H. Chang | ko |
| dc.contributor.author | Y. M. Koo | ko |
| dc.contributor.author | H. Padmore | ko |
| dc.date.accessioned | 2017-08-17T14:48:41Z | - |
| dc.date.available | 2017-08-17T14:48:41Z | - |
| dc.date.created | 2009-03-26 | - |
| dc.date.issued | 1996-01 | - |
| dc.identifier.citation | METALS AND MATERIALS INTERNATIONAL, v.2, no.1, pp.23 - 29 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/38508 | - |
| dc.language | English | - |
| dc.publisher | 대한금속재료학회 | - |
| dc.title | TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROSCOPY USING SYNCHROTRON RADIATION FOR TRACE IMPURITY ANALYSIS OF SILICON WAFER SURFACES | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.contributor.localauthor | Y. M. Koo | - |
| dc.contributor.nonIdAuthor | C. H. Chang | - |
| dc.contributor.nonIdAuthor | H. Padmore | - |
| dc.citation.endPage | 29 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 23 | - |
| dc.citation.title | METALS AND MATERIALS INTERNATIONAL | - |
| dc.citation.volume | 2 | - |
| dc.identifier.scopusid | 2-S2.0-10444228267 | - |
| dc.description.journalClass | 1 | - |
| dc.type.docType | Article | - |
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- 구양모KOO, YANG MO
- Ferrous & Energy Materials Technology