DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, MH | - |
dc.contributor.author | Lee, SI | - |
dc.contributor.author | Song, TK | - |
dc.contributor.author | Park, H | - |
dc.contributor.author | Choi, W | - |
dc.contributor.author | Yoo, HI | - |
dc.contributor.author | Park, TG | - |
dc.date.accessioned | 2017-08-17T14:57:14Z | - |
dc.date.available | 2017-08-17T14:57:14Z | - |
dc.date.created | 2010-05-04 | - |
dc.date.issued | 2001-11 | - |
dc.identifier.issn | 0256-1115 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/38685 | - |
dc.description.abstract | The electrical conductivity (sigma), photoconductivity and photocatalytic reactivity in doped crystalline TiO2 were measured as a function of the oxygen partial pressure (Po-2), temperature, doping type and UV irradiation. The Po, dependence of sigma suggests that the predominant atomic defects in pure TiO2 are oxygen vacancies (V-(o)double over dot) and interstitial titanium ions (Ti-(i) triple over dot), but the dominant defect is changed with Po-2 and temperature. The photoexcited electrons in reduced and/or n-type doped TiO2 enhance both the photoconductivity and the photocatalytic reactivity by the reduction process. Therefore, these behaviors are strongly dependent on the electron concentration. | - |
dc.language | English | - |
dc.publisher | 한국화학공학회 | - |
dc.relation.isPartOf | Korean Journal of Chemical Engineering | - |
dc.title | Correlations among defect type, photoconductivity and photoreactivity of doped TiO2 | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/BF02705611 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Korean Journal of Chemical Engineering, v.18, no.6, pp.873 - 878 | - |
dc.identifier.wosid | 000172558200015 | - |
dc.date.tcdate | 2019-02-01 | - |
dc.citation.endPage | 878 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 873 | - |
dc.citation.title | Korean Journal of Chemical Engineering | - |
dc.citation.volume | 18 | - |
dc.contributor.affiliatedAuthor | Choi, W | - |
dc.identifier.scopusid | 2-s2.0-0035561758 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 3 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | defect type | - |
dc.subject.keywordAuthor | photoconductivity | - |
dc.subject.keywordAuthor | photoreactivity | - |
dc.subject.keywordAuthor | charge compensation | - |
dc.subject.keywordAuthor | doping effect | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Engineering, Chemical | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.description.journalRegisteredClass | other | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Engineering | - |
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