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Cited 15 time in webofscience Cited 14 time in scopus
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dc.contributor.authorOH, JOON HAK-
dc.contributor.authorLee, Eun-Kyung-
dc.contributor.authorLee, Moo Yeol-
dc.contributor.authorChoi, Ajeong-
dc.contributor.authorKim, Joo-Young-
dc.contributor.authorKweon, O. Young-
dc.contributor.authorKim, Jung-Hwa-
dc.contributor.authorJung, Ji Young-
dc.contributor.authorShin, Tae-Joo-
dc.contributor.authorPark, Jeong-Il-
dc.contributor.authorLee, Sang Yoon-
dc.date.accessioned2018-01-04T06:42:31Z-
dc.date.available2018-01-04T06:42:31Z-
dc.date.created2017-10-26-
dc.date.issued2017-10-
dc.identifier.issn2199-160X-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/38995-
dc.description.abstractPhenyl-substituted heteroacene, diphenyl-dibenzothiopheno[6,5-b:6',5'-f]-thieno[3,2-b]thiophene (DPh-DBTTT), is introduced as a thermally durable high-performance organic semiconductor. The DPh-DBTTT single crystals exhibit hole mobility up to 31.9 cm(2) V-1 s(-1), and the vacuum-deposited DPh-DBTTT thin-film transistors show a maximum mobility of 6.32 cm(2) V-1 s(-1). X-ray crystallographic analysis reveals that the small tilting angle between the phenyl substituent and the DBTTT core reduces the reorganization energy dramatically. The structure-property relationships are thoroughly investigated using atomic force microscopy, transmission electron microscopy, and grazing incidence X-ray diffraction analyses, in addition to charge-transport studies. The vacuum-deposited DPh-DBTTT thin-film transistors show superior thermal durability compared to the core DBTTT, which is highly valuable for device processability.-
dc.languageEnglish-
dc.publisherWILEY-VCH Verlag GmbH & Co. KGaA, Weinheim-
dc.relation.isPartOfAdvanced Electronic Materials-
dc.titlePhenyl Derivative of Dibenzothiopheno[6,5-b:6′,5′-f]Thieno[3,2-b]Thiophene (DPh-DBTTT): High Thermally Durable Organic Semiconductor for High-Performance Organic Field-Effect Transistors-
dc.typeArticle-
dc.identifier.doi10.1002/aelm.201700142-
dc.type.rimsART-
dc.identifier.bibliographicCitationAdvanced Electronic Materials, v.3, no.10, pp.1700142-
dc.identifier.wosid000412593400001-
dc.date.tcdate2019-02-01-
dc.citation.number10-
dc.citation.startPage1700142-
dc.citation.titleAdvanced Electronic Materials-
dc.citation.volume3-
dc.contributor.affiliatedAuthorOH, JOON HAK-
dc.identifier.scopusid2-s2.0-85025451530-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc4-
dc.description.isOpenAccessN-
dc.type.docTypeARTICLE-
dc.subject.keywordPlusTHIN-FILM TRANSISTORS-
dc.subject.keywordPlusHIGH-MOBILITY-
dc.subject.keywordPlusSINGLE-CRYSTALS-
dc.subject.keywordPlusDIPHENYL DERIVATIVES-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusPOLYMERS-
dc.subject.keywordAuthororganic semiconductors-
dc.subject.keywordAuthororganic thin-film transistors-
dc.subject.keywordAuthorsingle-crystal field-effect transistors-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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오준학OH, JOON HAK
Dept. of Chemical Enginrg
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