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Showing results 1 to 1 of 1
Article
Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy
SCIE
SCOPUS
Ultramicroscopy, vol. 108, no. 10, page. 1045 - 1049, 2008-09
Lee, Joon Sung
;
Ryu, Sunmin
;
Yoo, Kwonjae
;
Kim, Jinhee
;
Choi, Insung S.
;
et al
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