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Article
Quantitative structure and property analysis of nanoporous low dielectric constant SiCOH thin filmsSCIESCOPUS

JOURNAL OF PHYSICAL CHEMISTRY C, vol. 111, no. 29, page. 10848 - 10854, 2007-07-26

Article
Grazing-incidence small-angle X-ray scattering studies on templating nanopores in networked polymer thin films with a multi-armed porogenSCIESCOPUS

JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. S631 - S636, 2007-04

Article
Synchrotron X-ray scattering and reflectivity studies of the structure of low dielectric constant SiOCH thin films prepared from bistrimethylsilylmethane by chemical vapor depositionSCIESCOPUS

JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. S614 - S619, 2007-04

Article
Synchrotron X-ray reflectivity studies of nanoporous organosilicate thin films with low dielectric constantsSCIESCOPUS

JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. S626 - S630, 2007-04

Article
Synchrotron x-ray reflectivity studies on nanoporous low dielectric constant organosilicate thin filmsSCIESCOPUSKCI

BULLETIN OF THE KOREAN CHEMICAL SOCIETY, vol. 28, no. 12, page. 2481 - 2485, 2007-12-20

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