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Atom Probe Tomography를 이용한 나노 스케일의 조성분석: Ⅱ.전자소자 및 나노재료에서의 응용
- Title
- Atom Probe Tomography를 이용한 나노 스케일의 조성분석: Ⅱ.전자소자 및 나노재료에서의 응용
- Authors
- Woo Young Jung; Chan Woo Bang; Dong Hyun Jang; Gil Ho Gu; 박찬경
- Date Issued
- 2011-06
- Publisher
- 한국현미경학회
- ISSN
- 1225-6773
- Article Type
- Article
- Citation
- 한국현미경학회지, vol. 41, no. 2, page. 89 - 98, 2011-06
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Communities & Collection
Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg