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Department of Materials Science & Engineering (신소재공학과)
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Article
Spectroscopic ellipsometric study of ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrate
SCIE
SCOPUS
KCI
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 44, no. 1, page. 129 - 132, 2004-01
Kang, TD
;
Lee, H
;
Park, WI
;
Yi, GC
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critical point
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dielectric function
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ellipsometry
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Holden model
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OPTICAL-CONSTANTS
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PHOTOREFLECTANCE SPECTRA
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ZINC-OXIDE
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2004
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